Submicronic Laue diffraction to determine in-depth strain in very closely matched complex HgCdTe/CdZnTe heterostructures with a 10^?5 resolution

Cross-sectional submicronic Laue diffraction has been successfully applied to HgCdTe/CdZnTe heterostructures provide accurate strain profiles from substrate surface. Combined with chemical-sensitive techniques, this approach allows correlation of lattice-mismatch, interface compositional gradient and while isolating specific layer contributions which would otherwise be averaged using conventional X-ray diffraction. The spatial resolution allowed by the synchrotron white beam size is particularly suited complex infrared detector designed structures such as dual-color detectors. extreme 10 ?5 required for very low lattice-mismatch system demonstrated.